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| بین المللی علوم (منتشر نمی شود) | ||
| مقاله 6، دوره 1، شماره 0 - شماره پیاپی 1358، بهار 1380 اصل مقاله (188.66 K) | ||
| نویسندگان | ||
A.Pazirandeh؛ N.Sobhkhiz 
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| عنوان مقاله [English] | ||
| - | ||
| چکیده [English] | ||
| Gamma-ray and X-ray are powerful tools for analysis of internal material micro-structure. The technique is based on studying the leakage spectrum. Two basic phenomena are involved in this work, namely photo-electric effect and Compton scattering. We derived the fundamental equations to calculate four components contributed in building up the leakage spectrum, which are Compton-Compton, Rayleigh-Compton, Compton-Rayleigh and Rayleigh -Rayleigh scattering. Results of our calculation and measurements for aluminum target showed very good agreement. | ||
| کلیدواژه‌ها [English] | ||
| Albedo spectrum, Coherent and incoherent scattering, Compton scattering, Double scattering, Rayleigh scattering | ||
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آمار تعداد مشاهده مقاله: 726 تعداد دریافت فایل اصل مقاله: 790 |
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